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In any micrograph, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or probe-induced sample damage. How can we optimize the sensitivity of a microscope and maximize the information that can be extracted from each detected probe particle?
We employ cavity enhancement, quantum enhancement, and wave-front shaping techniques to optimize the sensitivity of interferometric imaging techniques. We do so both in electron and light microscopy.
Thomas Juffmann did his PhD on molecular quantum optics at the University of Vienna. He then moved to Stanford to work on quantum enhanced imaging with electrons and photons. After that, he joined the ENS Paris as an interdisciplinary HFSP fellow working on adaptive optics. In 2018, he started the Quantum Imaging and Biophysics group in a joint venture between the Faculty of Physics and the Max Perutz Labs.
VBC5
Room: 1.610
+43 1 4277 72520
Passing probe particles through a sample multiple times can increase the signal to noise per detected particle. We demonstrated full field cavity enhanced microscopy with light [1], and are now extending this approach to iScat measurments. We also showed theoretically [2], that the same principle could enable cryogenic electron microscopy at unprecedented low damage levels. The first multi-pass TEM is now in the making [3].
[1] Multi-pass microscopy; T. Juffmann, B. B. Klopfer, T. L.I. Frankort, P. Haslinger & M. A. Kasevich; Nature Communications, Vol. 7, 12858 (2016)
[2] Multi-pass transmission electron microscopy; T. Juffmann, S. A. Koppell, B. B. Klopfer, C. Ophus, R. M. Glaeser & M. A. Kasevich; Scientific Reports, Vol. 7, 1699 (2017)
[3] Design for a 10 keV multi-pass transmission electron microscope; S. A. Koppell, M. Mankos, A. J. Bowman, Y. Israel, T. Juffmann, B. B. Klopfer, M. A. Kasevich; Ultramicroscopy, Vol. 207, 112834 (2019)
Phase microscopy is based on interfering a signal wave with a reference wave. Depending on local, sample induced phase-shifts, the sensitivity of the most common phase microscopy techniques can be far from ideal. We could show this deriving the Cramer Rao bounds in phase imaging for any linear optical system [4]. Local Wave-front shaping for Phase Imaging (Lowphi) can then be used to adaptively optimize your microscope to a specific sample [5].
[4] Fundamental bounds on the precision of classical phase microscopes; D. Bouchet, J. Dong, D. Maestre, and T. Juffmann; arXiv:2011.04799 (2020)
[5] Local Optimization of Wave-fronts for high sensitivity Phase Imaging; T. Juffmann, A. de los Rios Sommer, S. Gigan; Optics Communications, Vol. 454, 124484 (2020)
Cisse De Locht
Technician +43 1 4277 72521
Room: 1.812.4
Victoria Helm
Master Student +43 1 4277 72524
Room: 1.614
Luis Ixquiac
Master Student +43 1 4277 52213
Room: 1.211
Hanieh Jafarian
PhD Student +43 1 4277 72522
Room: 1.722
Thomas Juffmann
Group Leader +43 1 4277 72520
Room: 1.610
Sami Khawam
PostDoc +43 1 4277 74320
Room: 1.610
Tilman Kräft
Master Student +43 1 4277 72523
Room: 18125
Oliver Lueghamer
PhD Student +43 1 4277 72522
Room: 1.722
Ivana Matousova Visova
PostDoc +43 1 4277 72524
Room: 1.614
Magnus McMillan
Master Student +43 1 4277 72524
Room: 1.722
Sepehr Pouladi
Master Student +43 1 4277 72524
Room: 1.614
Philipp Redfern
Master Student +43 1 4277 72522
Room: 1.211
Martino Zanetti
PhD Student +43 1 4277 72523
Room: 1.812.5
Timon Zipfelmaier
Master Student +43 1 4277 74320
Ilia Zykov
PhD Student +43 1 4277 72522
Room: 1.722
Pulsed laser deposition assisted epitaxial growth of cesium telluride photocathodes for high brightness electron sources
K.P. Mondal, M. Gaowei, E. Echeverria, K. Evans-Lutterodt, J. Jordan-Sweet, T. Juffmann, S. Karkare, J. Maxson, SJ van der Molen, C. Pennington, P. Saha, J. Smedley, WG Stam, R. M. Tromp et al.
A structural analysis of ordered Cs3Sb films grown on single crystal graphene and silicon carbide substrates
C. A. Pennington, M. Gaowei, E. M. Echeverria, K. Evans-Lutterodt, A. Galdi, T. Juffmann, S. Karkare, J. Maxson, S. J. van der Molen, P. Saha, J. Smedley, W. G. Stam, R. M. Tromp
Unified Simulation Platform for Interference Microscopy
F. Hitzelhammer, A. Dostálová, I. Zykov, B. Platzer, C. Conrad-Billroth, T. Juffmann, U. Hohenester
Growth of ultra-flat ultra-thin alkali antimonide photocathode films
G. WG Stam, M. Gaowei, EM. Echeverria, K. Evans-Lutterodt, J. Jordan-Sweet, T. Juffmann, S. Karkare, J. Maxson, SJ van der Molen, C. Pennington, P. Saha, J. Smedley, RM Tromp
Quantum Limits of Position and Polarizability Estimation in the Optical Near Field
L. Kienesberger, T. Juffmann, S. Nimmrichter
